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Yves BorlezParticipantYves Borlez November 23, 2017 at 7:04 am in reply to: "Max Input" / "Ref Offset" parameters understanding for EMI precompliance //php bbp_reply_id(); ?>
Please find enclosed the related pictures.
Best regards,
Yves Borlez
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Yves BorlezParticipantYves Borlez November 23, 2017 at 7:02 am in reply to: "Max Input" / "Ref Offset" parameters understanding for EMI precompliance //php bbp_reply_id(); ?>
Dear Sir,
I face a similar situation as Vincent when trying to do measurements on a wide band noise source (Radiated emissions measurement and calibration). When changing the “Max Input” Setting, sometimes, the curves is shifted towards upper or sometimes lower measured values, or its shape is modified.
This makes me confused on the right level to choose. Why would it be so dependant on the max hold value, provided we stay away from Saturation ????
Another clue I use is the “IF Overload” message appearing on the top left corner of the screen. I was guessing that to have the maximum dynamic range, I should set the “Max input” parameter, just above the level where we have “IF overload”. The message then disapears and I was expecting the measurement to be OK. Nevertheless, if I increase further the “max hold” value, the curve is still changing a lot !. I have tried to respect your recommendation of having the highest signal about 5 dB below max input level, but is this the same for wideband noise source ?
I would need to have a clear explanation on the relative “hardware” and “software” effects of settings like “Attenuation Factor”, “Max Input” and “Ref Offset”.
For example, the Ref Offset has an influence on IF Overload, while the attenuation factor does not, it is just a software compensation for input attenuation.
See in annexe pictures measurement results for “Max input” parameter set between 70dBµV and 100 dBµV.
Please advice,
Thanks you in advance and best regards,
Yves Borlez
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